Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified Applications for the PELCO® Pro

Applications for the PELCO® Pro Gold Plated Tweezers include microelectronics

Pattern Size 10µm 5µm 2µm 1µm 0

Also offered is a cleaning service and a recertification program

and PF TUNA packages

and some adhesion and dissipation contrast as well

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified Applications for the PELCO® ProDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um