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PELCO® 200nm Silicon Nitride Support Films for TEM AFM Calibration Specimens copper -pkg/25

SKU: 2980423057

4.1
USD122.83 USD165.83

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Ships within 48 hours · Estimated delivery Aug 17 - Aug 22

Description

copper -pkg/25

The pattern is fabricated using 30nm CrO2 over 40nm Cr on quartz

Resistant to UV and nuclear radiation

a) Think film samples of polycaprolactone (PCL

Size: 51 x 71mm (2" x 2

PELCO® 200nm Silicon Nitride Support Films for TEM AFM Calibration Specimens copper -pkg/25DESCRIPTION PRODUCT SPECIFICATIONS 200nm membrane thickness 200m frame thickness 21525 10 21525 100 21520 10 21520 100 21521 10 21521 100 21522 10 21522 100 21524 10 21524 100 21528 10 21529 10 Silicon Nitride Support Film, 200nm with 0. 25 x 0. 25mm Window Silicon Nitride Support Film, 200nm with 0. 25 x 0. 25mm Window Silicon Nitride Support Film, 200nm with 0. 5 x 0. 5mm Window Silicon Nitride Support Film, 200nm with 0. 5 x 0. 5mm Window Silicon

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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