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7mm) pin stub with 1/8" (3
finder or index grids
The central line area may be used for AFM measurements
Optical Microscopy: reflected
electronics
SiC-STEP Calibration Samples Step Height:0.75nm 7mm) pin stub with 1/8"DESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
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