SCM-PTSI 15 nm Incorporated into the standard are

Incorporated into the standard are X & Y rulers with 6mm length with 1µm increments

and DTFMLPC

5 100 260 230 30 78 150 180 140 40 60 Hex Mesh 50 530 450 80 72 75 359 300 50 73

The plasticity is permanent

Boot for Second Generation Dimension EC Cell

SCM-PTSI 15 nm Incorporated into the standard are2. 8N m, 75kHz, 4 Sided Tip, Conductive PtSi Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker SCM PtSi Probes For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its