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Special Small Pin Stub, aluminum, grooved edge DEKTAK XTL 667-200-AU - Ultrathin Carbon on

SKU: 6779127581

4.3
USD102.22 USD140.22

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Ships within 48 hours · Estimated delivery Aug 16 - Aug 21

Description

667-200-AU - Ultrathin Carbon on Quantifoil®

Daniel B Allred

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

XPS and AFM on the same silicon nitride support film

good conductivity

Special Small Pin Stub, aluminum, grooved edge DEKTAK XTL 667-200-AU - Ultrathin Carbon onDESCRIPTION Special Small Head 9. 6mm x 8mm pin height Special Small Pin Stub for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, Leica, CamScan), aluminum, grooved edge pkg 50

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