PELCO X-CHECKER™ Wafer Conductive 3 BAR PATTERNS from

3 BAR PATTERNS from

is stable under the electron beam and is less hydrophobic than carbon

EasyGrip™ Edge

hot water or steam

package of 100 grids

PELCO X-CHECKER™ Wafer Conductive 3 BAR PATTERNS fromDESCRIPTION The PELCO X Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X Checker Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations. The #602 20 and #602 21 contain: Copper disc to check spectral calibration Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution Nickel 400 mesh TEM grid for imaging