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Recommended for Dimension SPM
· The standard HarmoniX probe (part HMX) is capable of measuring the material modulus values ranging from about 10MPa to 10GPa
Bruker SCM-PtSi Probes
8N/m spring constant
5 Back Angle: 25 ± 2
APSH-0050 Automated AFM Recommended for Dimension SPMCP II sample bias holder DESCRIPTION Sample bias holder for CPII Innova has connectors to apply an external sample bias voltage. This type of sample holder is used to hold a flat sample, such as a piece of semiconductor material. The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option.
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